DocumentCode
2999426
Title
Methods and Metrics to improve the Yield of IT using the IT-CMF - an Intel Case Study
Author
Curley, Martin ; Kenneally, Jim
fYear
2007
fDate
19-21 March 2007
Firstpage
27
Lastpage
38
Abstract
This paper provides an overview of the IT capability maturity framework (IT-CMFTM) with a specific focus on the value metrics. The IT-CMFTM is an integrating CIO level framework based on the synthesis of academic research and industry best practice which can help CIOs increase the value that IT delivers and improve the productivity of the IT function. The paper introduces nascent macro measures of IT value performance illustrated with examples and data from an Intel IT case study.
Keywords
Capability Maturity Model; information technology; investment; IT productivity; IT value performance; IT yield improvement; capability maturity framework; chief information officer level framework; information technology; nascent macro measures; value metrics; Availability; Banking; Best practices; Computer crashes; Control systems; Costs; Investments; Pressure measurement; Productivity; Technological innovation; IT yield;
fLanguage
English
Publisher
ieee
Conference_Titel
Exploring Quantifiable IT Yields, 2007. EQUITY '07. IEEE International Conference on
Conference_Location
Amsterdam
Print_ISBN
978-1-4244-2537-2
Type
conf
DOI
10.1109/EQUITY.2007.12
Filename
5206408
Link To Document