DocumentCode
3001527
Title
An algorithm for diagnostics with signature analyzer
Author
Chan, John C. ; Womack, Baxter F.
Author_Institution
IBM Corp., Austin, TX, USA
fYear
1990
fDate
13-15 Feb 1990
Firstpage
69
Lastpage
74
Abstract
An algorithm for fault diagnosis that makes use of the information from a faulty signature is presented. The idea is to search the likely error locations before the tests are performed. The method reduces the number of tests required to diagnose the errors with the probability of aliasing. Such probability is always smaller than that of error detection in signature analysis. When matching tests are difficult or impossible, the method provides an estimate of where errors that caused the incorrect signature might have occurred. Also, the case of `don´t cares´ at the input sequence of signature analysis is discussed. The algorithm can be readily implemented in software with the faulty signature as the only input variable. The proposed fault diagnostic scheme has an advantage over exhaustive testing in that it leads to fault isolation in a homing-in manner
Keywords
computer testing; error detection; fault location; logic analysers; logic testing; probability; signal processing equipment; algorithm; aliasing; board level testing; combinational circuit; computer testing; error detection; error locations; fault diagnosis; fault isolation; matching tests; probability; signature analyzer; Algorithm design and analysis; Circuit faults; Circuit testing; Computer errors; Fault detection; Fault diagnosis; Hardware; Performance evaluation; Polynomials; Sequential analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 1990. IMTC-90. Conference Record., 7th IEEE
Conference_Location
San Jose, CA
Type
conf
DOI
10.1109/IMTC.1990.65963
Filename
65963
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