• DocumentCode
    3001527
  • Title

    An algorithm for diagnostics with signature analyzer

  • Author

    Chan, John C. ; Womack, Baxter F.

  • Author_Institution
    IBM Corp., Austin, TX, USA
  • fYear
    1990
  • fDate
    13-15 Feb 1990
  • Firstpage
    69
  • Lastpage
    74
  • Abstract
    An algorithm for fault diagnosis that makes use of the information from a faulty signature is presented. The idea is to search the likely error locations before the tests are performed. The method reduces the number of tests required to diagnose the errors with the probability of aliasing. Such probability is always smaller than that of error detection in signature analysis. When matching tests are difficult or impossible, the method provides an estimate of where errors that caused the incorrect signature might have occurred. Also, the case of `don´t cares´ at the input sequence of signature analysis is discussed. The algorithm can be readily implemented in software with the faulty signature as the only input variable. The proposed fault diagnostic scheme has an advantage over exhaustive testing in that it leads to fault isolation in a homing-in manner
  • Keywords
    computer testing; error detection; fault location; logic analysers; logic testing; probability; signal processing equipment; algorithm; aliasing; board level testing; combinational circuit; computer testing; error detection; error locations; fault diagnosis; fault isolation; matching tests; probability; signature analyzer; Algorithm design and analysis; Circuit faults; Circuit testing; Computer errors; Fault detection; Fault diagnosis; Hardware; Performance evaluation; Polynomials; Sequential analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 1990. IMTC-90. Conference Record., 7th IEEE
  • Conference_Location
    San Jose, CA
  • Type

    conf

  • DOI
    10.1109/IMTC.1990.65963
  • Filename
    65963