• DocumentCode
    3002394
  • Title

    An improved modular approach for dynamic fault tree analysis

  • Author

    Yevkin, Olexandr

  • Author_Institution
    R&D Dept., Dyadem Int. Ltd., Toronto, ON, Canada
  • fYear
    2011
  • fDate
    24-27 Jan. 2011
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Modularization technique allows efficient simplification of Dynamic and Static Fault Tree (FT). Each independent sub-tree (module) in static FT can be calculated separately and substituted by a basic event with obtained probability of failure. However, there is a significant restriction of this procedure in Dynamic FT, if it is converted to a Markov Chain. An independent sub-tree inside of Dynamic FT cannot be converted to basic event in general case, because corresponding Failure Rate (FR) is not constant and is not defined at arbitrary time. In the present paper we consider a set of cases when this modularization technique is still possible inside a Dynamic FT.
  • Keywords
    Markov processes; fault trees; probability; Markov chain; dynamic fault tree analysis; failure probability; failure rate; independent sub-tree; modularization technique; static fault tree; Approximation methods; Differential equations; Discrete Fourier transforms; Fault trees; Logic gates; Markov processes; Reliability; dynamic fault tree; modular approach; system reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium (RAMS), 2011 Proceedings - Annual
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0149-144X
  • Print_ISBN
    978-1-4244-8857-5
  • Type

    conf

  • DOI
    10.1109/RAMS.2011.5754437
  • Filename
    5754437