• DocumentCode
    3002573
  • Title

    Planning a reliability growth program utilizing historical data

  • Author

    Crow, Larry H.

  • Author_Institution
    Crow Reliability Resources, Madison, AL, USA
  • fYear
    2011
  • fDate
    24-27 Jan. 2011
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    From historical data this paper will note the significant patterns and key parameters that provide the basis for general guidelines that are very useful in establishing a realistic reliability growth testing program. These guidelines also address concerns raised by the 2008 Defense Science Board Task Force addressing reliability. As noted by this Task Force two major risks areas are the initial MTBF and the Growth Potential MTBF. In particular, the Defense Board Task Force report, Ref. 10, found that the “low initial MTBF and low Growth Potential are the most significant reasons that systems are failing to meet their operational suitability requirements.” This paper will address data and experiences on these two key parameters and provide practical information on how they are managed. The information on these two key parameters and additional information on other parameters, such as growth rates, are very useful in reducing the risks and cost of a reliability growth program. In addition to the data, guidelines will be given regarding the use of these parameters to address the concerns of the Defense Science Board Task Force.
  • Keywords
    cost reduction; planning; reliability; risk analysis; Defense Science Board Task Force; cost reduction; growth potential; historical data; operational suitability requirements; reliability growth testing program; risk reduction; Data models; Equations; Mathematical model; Planning; Reliability engineering; Testing; Discovery Rate; Fix Effectiveness Factor; Growth Rate; Historical Reliability Data; Planned Growth Curves;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium (RAMS), 2011 Proceedings - Annual
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0149-144X
  • Print_ISBN
    978-1-4244-8857-5
  • Type

    conf

  • DOI
    10.1109/RAMS.2011.5754446
  • Filename
    5754446