Parameter Estimation of Noise Distribution Model of Electron Multiplying CCD Based on the Moment Estimation

Author

Zou, Pan ; Liu, Hui ; Zhang, Wenwen ; Chen, Qian ; Gu, Guohua ; Zhang, Liandong

Author_Institution

Sci. & Technol. on Low-Light-Level Night Vision Lab., Xian, China

fYear

2012

fDate

21-23 May 2012

Firstpage

1

Lastpage

4

Abstract

The electron multiplying CCD (EMCCD) use impact ionization to provide high gain in the charge domain. This enables performance with an equivalent input noise of much less than 1 rms electron at pixel rates. Based on the discussion of image noise sources and their statistic characteristics of the EMCCD, the noise distribution model is established. The method of moment estimation is applied to complete the parameter estimation of noise distribution model of the EMCCD. A Monte Carlo method is used to do the simulation calculations. Simulation results verify the effectiveness of the method of moment estimation. Acquiring series of images from the EMCCD when there is no signal input, experimental results demonstrate that parameter estimation values agree fairly well with the EMCCD camera parameters.

Keywords

CCD image sensors; Monte Carlo methods; electron device noise; electron multiplier detectors; method of moments; parameter estimation; EMCCD camera parameter; Monte Carlo method; electron multiplying CCD; image noise source; impact ionization; method of moment estimation; noise distribution model; parameter estimation; Cameras; Charge coupled devices; Estimation; Moment methods; Monte Carlo methods; Noise; Parameter estimation;

fLanguage

English

Publisher

ieee

Conference_Titel

Photonics and Optoelectronics (SOPO), 2012 Symposium on

Conference_Location

Shanghai

ISSN

2156-8464

Print_ISBN

978-1-4577-0909-8

Type

conf

DOI

10.1109/SOPO.2012.6271008

Filename

6271008