• DocumentCode
    3004846
  • Title

    Unsupervised Maximum Margin Feature Selection with manifold regularization

  • Author

    Bin Zhao ; Kwok, James ; Fei Wang ; Changshui Zhang

  • Author_Institution
    Dept. of Autom., Tsinghua Univ., Beijing, China
  • fYear
    2009
  • fDate
    20-25 June 2009
  • Firstpage
    888
  • Lastpage
    895
  • Abstract
    Feature selection plays a fundamental role in many pattern recognition problems. However, most efforts have been focused on the supervised scenario, while unsupervised feature selection remains as a rarely touched research topic. In this paper, we propose manifold-based maximum margin feature selection (M3FS) to select the most discriminative features for clustering. M3FS targets to find those features that would result in the maximal separation of different clusters and incorporates manifold information by enforcing smoothness constraint on the clustering function. Specifically, we define scale factor for each feature to measure its relevance to clustering, and irrelevant features are identified by assigning zero weights. Feature selection is then achieved by the sparsity constraints on scale factors. Computationally, M3FS is formulated as an integer programming problem and we propose a cutting plane algorithm to efficiently solve it. Experimental results on both toy and real-world data sets demonstrate its effectiveness.
  • Keywords
    feature extraction; integer programming; pattern clustering; cutting plane algorithm; discriminative features; integer programming problem; manifold information; manifold regularization; pattern clustering; pattern recognition; smoothness constraint; sparsity constraint; unsupervised maximum margin feature selection; Clustering algorithms; Face recognition; Feature extraction; Filters; Laboratories; Laplace equations; Linear programming; Pattern recognition; Supervised learning; Unsupervised learning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition, 2009. CVPR 2009. IEEE Conference on
  • Conference_Location
    Miami, FL
  • ISSN
    1063-6919
  • Print_ISBN
    978-1-4244-3992-8
  • Type

    conf

  • DOI
    10.1109/CVPR.2009.5206682
  • Filename
    5206682