• DocumentCode
    3005702
  • Title

    Learning IMED via shift-invariant transformation

  • Author

    Sun Bing ; Feng Jufu ; Wang Liwei

  • Author_Institution
    Dept. of Machine Intell., Peking Univ., Beijing, China
  • fYear
    2009
  • fDate
    20-25 June 2009
  • Firstpage
    1398
  • Lastpage
    1405
  • Abstract
    The IMage Euclidean Distance (IMED) is a class of image metrics, in which the spatial relationship between pixels is taken into consideration. It was shown that calculating the IMED of two images is equivalent to performing a linear transformation called Standardizing Transform (ST) and then followed by the traditional Euclidean distance. However, while the IMED is invariant to image shift, the ST is not a Shift-Invariant (SI) filter. This left as an open problem whether IMED is equivalent to SI transformation plus traditional Euclidean distance. In this paper, we give a positive answer to this open problem. Specifically, for a wider class of metrics, including IMED, we construct closed-form SI transforms. Based on the SI metric-transform connection, we next develop an image metric learning algorithm by learning a metric filter in the transform domain. This is different from all previous metric approaches. Experimental results on benchmark datasets demonstrate that the learned image metric has promising performances.
  • Keywords
    filtering theory; image processing; learning (artificial intelligence); transforms; IMage Euclidean Distance learning; image metric learning algorithm; image shift; linear transformation; metric filter learning; pixel spatial relationship; shift-invariant filter; shift-invariant transformation; standardizing transform; transform domain; Euclidean distance; Filters; Laboratories; Linear discriminant analysis; Machine intelligence; Machine learning; Pixel; Sun; Support vector machine classification; Support vector machines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition, 2009. CVPR 2009. IEEE Conference on
  • Conference_Location
    Miami, FL
  • ISSN
    1063-6919
  • Print_ISBN
    978-1-4244-3992-8
  • Type

    conf

  • DOI
    10.1109/CVPR.2009.5206720
  • Filename
    5206720