Characterization of miniature near field probes for IC´s radiation measurements

Author

Avram, Cristian ; Gavrila, Gheorghe ; Tao, Junwu

Author_Institution

Mil. Tech. Acad., Bucharest, Romania

fYear

2010

fDate

10-12 June 2010

Firstpage

275

Lastpage

278

Abstract

In this paper, the near-field scan bench developed at Electronics Laboratory at ENSEEIHT is presented. A simple methodology for calibrating the miniature probes is described, which allows to determine the electromagnetic radiation levels from an IC without needing fastidious post-processing calculations. Then, the near-field emissions from a imager integrated circuit are measured and analyzed. Scan results give accurate information about current flows and voltage drops and parasite coupling inside the component.

Keywords

electric potential; electromagnetic coupling; electromagnetic waves; integrated circuit measurement; probes; current flow; electromagnetic radiation level; imager integrated circuit; miniature near field probes; near-field emission; near-field scan; parasite coupling; radiation measurement; voltage drop; Calibration; Electromagnetic measurements; Electromagnetic radiation; Frequency measurement; Integrated circuit measurements; Magnetic fields; Near-field radiation pattern; Probes; Spectral analysis; Voltage; IC emission measurement; electromagnetic radiation; near field scan; probe calibration;

fLanguage

English

Publisher

ieee

Conference_Titel

Communications (COMM), 2010 8th International Conference on

Conference_Location

Bucharest

Print_ISBN

978-1-4244-6360-2

Type

conf

DOI

10.1109/ICCOMM.2010.5509042

Filename

5509042