DocumentCode
3009908
Title
Polymer cure modeling for microelectronics applications
Author
Morris, James E. ; Tilford, Tim ; Bailey, Chris ; Sinclair, Keith I. ; Desmulliez, Marc P Y
Author_Institution
Dept. of Electr. & Comput. Eng., Portland State Univ., Portland, OR, USA
fYear
2009
fDate
13-17 May 2009
Firstpage
1
Lastpage
6
Abstract
A review of polymer cure models used in microelectronics packaging applications reveals no clear consensus of the chemical rate constants for the cure reactions, or even of an effective model. The problem lies in the contrast between the actual cure process, which involves a sequence of distinct chemical reactions, and the models, which typically assume only one, (or two with some restrictions on the independence of their characteristic constants.) The standard techniques to determine the model parameters are based on differential scanning calorimetry (DSC), which cannot distinguish between the reactions, and hence yields results useful only under the same conditions, which completely misses the point of modeling. The obvious solution is for manufacturers to provide the modeling parameters, but failing that, an alternative experimental technique is required to determine individual reaction parameters, e.g. Fourier transform infra-red spectroscopy (FTIR).
Keywords
chemical reactions; curing; differential scanning calorimetry; integrated circuit packaging; polymers; chemical rate constants; differential scanning calorimetry; distinct chemical reactions; individual reaction parameters; microelectronics packaging applications; polymer cure modeling parameters; Application software; Chemicals; Electric resistance; Isothermal processes; Mathematical model; Microelectronics; Microwave ovens; Packaging; Polymers; Temperature dependence;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Technology, 2009. ISSE 2009. 32nd International Spring Seminar on
Conference_Location
Brno
Print_ISBN
978-1-4244-4260-7
Type
conf
DOI
10.1109/ISSE.2009.5206929
Filename
5206929
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