DocumentCode
3010760
Title
Using integrated diagnostics on automatic test equipment
Author
Franco, John R., Jr.
Author_Institution
Harris Corp., Syosset, NY, USA
fYear
1991
fDate
24-26 Sep 1991
Firstpage
337
Lastpage
343
Abstract
The author addresses the use of integrated diagnostic tools and techniques as applied to automatic test equipment (ATE) and test program sets (TPSs). The use of the tools provided as part of the integrated diagnostic support system (IDSS), namely, the weapon system testability analyzer (WSTA), the adaptive diagnostic system (ADS), and the use of electronic data delivery for technical documentation, is addressed
Keywords
automatic test equipment; automatic testing; electronic engineering computing; fault location; military computing; weapons; ATE; adaptive diagnostic system; automatic test equipment; electronic data delivery; integrated diagnostics; technical documentation; test program sets; weapon system testability analyzer; Adaptive systems; Automatic test equipment; Costs; Documentation; Information analysis; Life testing; Procurement; System testing; Test equipment; Weapons;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON '91. IEEE Systems Readiness Technology Conference. Improving Systems Effectiveness in the Changing Environment of the '90s, Conference Record.
Conference_Location
Anaheim, CA
Print_ISBN
0-87942-576-8
Type
conf
DOI
10.1109/AUTEST.1991.197571
Filename
197571
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