DocumentCode
3011568
Title
Failure analysis results systematization
Author
Nagynémedi, Csaba ; Harkai, Endre ; Rigler, Dániel ; Kovács, Róbert ; Balogh, Bálint ; Gordon, Péter
Author_Institution
Dept. of Electron. Technol., Budapest Univ. of Technol. & Econ., Budapest, Hungary
fYear
2009
fDate
13-17 May 2009
Firstpage
1
Lastpage
5
Abstract
At the Department of Electronics Technology high amount of failure analysis inspections have been carried out during the last five years, thus an outstanding number of results and reports have been accumulated by the Failure Analysis Group. The results and experiences gained in the past by these analyses can provide useful information in the present and future in further cases which show similarities to former problems. Such knowledge can only be exploited if the analysis results are organized in a suitable structure and the researchers do not have to rely on their own memory. A suitable system should handle queries based on various approaches i.e. type of failure, involved component, during which process the failure occurred, applied analysis method, etc. So the analysis result storage system has to provide a possibility to find any earlier analysis result which can be in connection with current cases to provide us the previously gained experiences and conclusions. In case a lecturer wants to illustrate a presentation with images of a certain failure type or of a given analysis method then the time needed to find the right pictures can be significantly reduced by the help of the analysis database.
Keywords
X-ray microscopy; failure analysis; optical microscopy; scanning electron microscopy; analysis database; failure analysis inspections; storage system; Assembly; Atom optics; Failure analysis; Image analysis; Image databases; Information analysis; Inspection; Optical devices; Optical microscopy; Soldering;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Technology, 2009. ISSE 2009. 32nd International Spring Seminar on
Conference_Location
Brno
Print_ISBN
978-1-4244-4260-7
Type
conf
DOI
10.1109/ISSE.2009.5207016
Filename
5207016
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