DocumentCode
3012669
Title
Energy Distribution Of Tunneling Emission From Si-gate MOS Cathode
Author
Yokoo, K. ; Sato, S. ; Koshita, G. ; Murota, J. ; Ono, S.
Author_Institution
Tohoku University
fYear
1993
fDate
12-15 Jul 1993
Firstpage
169
Lastpage
170
Keywords
Acceleration; Amorphous materials; Cathodes; Current density; Electron emission; Low voltage; Reproducibility of results; Scattering; Steady-state; Tunneling;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Microelectronics Conference, 1993., Proceedings of IEEE 6th International
Print_ISBN
0-7803-0852-2
Type
conf
DOI
10.1109/IVMC.1993.700336
Filename
700336
Link To Document