• DocumentCode
    3015639
  • Title

    An algorithm for strain reconstruction from irregularly sampled, incomplete measurements.

  • Author

    Danilouchkine, Mikhail G. ; Mastik, Frits ; Van der Steen, Antonius F W

  • Author_Institution
    Dept. of Biomed. Eng., Erasmus MC, Rotterdam
  • fYear
    2008
  • fDate
    2-5 Nov. 2008
  • Firstpage
    329
  • Lastpage
    332
  • Abstract
    This study proposes a novel algorithm for luminal strain reconstruction from sparse irregularly sampled strain measurements. It is based on the Normalized Convolution (NC) algorithm. The novel extension comprises the multiresolution scheme, which takes into account the fact the sample density of the available strain measurements varies during the cardiac cycle. The algorithm was applied for the luminal strain reconstruction in in-vivo Intravascular Ultrasound (IVUS) pullbacks. The high quality of strain restoration was observed after systematically removing up to 80% of the initial elastographic measurements. The restored distributions accurately reproduced the original strain patterns and the error did not exceed 12%. The experimental validation on 8 in-vivo IVUS pullbacks demonstrated that the relative decrease in number of invalid strain estimates amounts to 92:05plusmn6:03 and 99:17plusmn0:92 for the traditional and reconstructive strain computational scheme. In conclusion, implementation of reconstructive compounding scheme boosts the diagnostic value of IVUS Palpography.
  • Keywords
    biomedical ultrasonics; strain measurement; IVUS Palpography; intravascular ultrasound; luminal strain reconstruction; multiresolution scheme; normalized convolution algorithm; Biomedical measurements; Capacitive sensors; Cardiology; Convolution; Lesions; Lipidomics; Radio frequency; Strain measurement; Ultrasonic imaging; Ultrasonic variables measurement; Atherosclerotic Plaque; Coronary Arteries; IVUS; Normalized Convolution; Strain Reconstruction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 2008. IUS 2008. IEEE
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-2428-3
  • Electronic_ISBN
    978-1-4244-2480-1
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2008.0081
  • Filename
    4803162