DocumentCode
3015662
Title
Proceedings Design, Automation and Test in Europe. Conference and Exhibition 2001
fYear
2001
fDate
13-16 March 2001
Abstract
The following topics were dealt with. IP-based design; design languages; BIST; SoC testing; low-power systems; test generation; VLIW; on-line testing; packaging; mixed-signal circuits; power optimisation; interconnects; routing; layout generation; reconfigurable computing; embedded systems; and system verification
Keywords
application specific integrated circuits; built-in self test; circuit optimisation; embedded systems; formal verification; high level languages; industrial property; integrated circuit interconnections; integrated circuit testing; low-power electronics; mixed analogue-digital integrated circuits; network routing; packaging; parallel architectures; reconfigurable architectures; BIST; IP-based design; SoC testing; VLIW; design language; embedded systems; interconnects; layout generation; low-power systems; mixed-signal circuits; on-line testing; packaging; power optimisation; reconfigurable computing; routing; system verification; test generation;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe, 2001. Conference and Exhibition 2001. Proceedings
Conference_Location
Munich, Germany
ISSN
1530-1591
Print_ISBN
0-7695-0993-2
Type
conf
DOI
10.1109/DATE.2001.914991
Filename
914991
Link To Document