DocumentCode
3016762
Title
Research on Testability Design of Microwave Module
Author
Yin Jun ; Xu Yan Feng
Author_Institution
41st Res. Inst., Nat. Key Lab. of Sci. & Technol. on Electron. Test & Meas., China Electron. Technol. Group Corp., Qingdao, China
fYear
2010
fDate
25-27 June 2010
Firstpage
5535
Lastpage
5537
Abstract
In the study, the distributing regularities of microwave module´s faults are obtained combined the module´s feature. The testability design of the microwave module is studied, and especially the module´s testability design of the microwave octave band filter is realized. Finally, some achievements are acquired, including the rapid localization and renovation of the microwave module and even all the electronic system´s faults. All those will play an important part in the testability design of microwave module.
Keywords
fault diagnosis; microwave integrated circuits; electronic system fault; microwave module; microwave octave band filter; testability design; MMICs; Microwave FET integrated circuits; Microwave circuits; Microwave filters; Microwave measurements; fault diagnosis; microwave module; testability;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical and Control Engineering (ICECE), 2010 International Conference on
Conference_Location
Wuhan
Print_ISBN
978-1-4244-6880-5
Type
conf
DOI
10.1109/iCECE.2010.1345
Filename
5631766
Link To Document