• DocumentCode
    3016762
  • Title

    Research on Testability Design of Microwave Module

  • Author

    Yin Jun ; Xu Yan Feng

  • Author_Institution
    41st Res. Inst., Nat. Key Lab. of Sci. & Technol. on Electron. Test & Meas., China Electron. Technol. Group Corp., Qingdao, China
  • fYear
    2010
  • fDate
    25-27 June 2010
  • Firstpage
    5535
  • Lastpage
    5537
  • Abstract
    In the study, the distributing regularities of microwave module´s faults are obtained combined the module´s feature. The testability design of the microwave module is studied, and especially the module´s testability design of the microwave octave band filter is realized. Finally, some achievements are acquired, including the rapid localization and renovation of the microwave module and even all the electronic system´s faults. All those will play an important part in the testability design of microwave module.
  • Keywords
    fault diagnosis; microwave integrated circuits; electronic system fault; microwave module; microwave octave band filter; testability design; MMICs; Microwave FET integrated circuits; Microwave circuits; Microwave filters; Microwave measurements; fault diagnosis; microwave module; testability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical and Control Engineering (ICECE), 2010 International Conference on
  • Conference_Location
    Wuhan
  • Print_ISBN
    978-1-4244-6880-5
  • Type

    conf

  • DOI
    10.1109/iCECE.2010.1345
  • Filename
    5631766