Circuit Independent Weighted Pseudo-Random BIST Pattern Generator

This paper describes a circuit independent weighted pseudo random BIST pattern generator based on bit-flipping. The circuit dependent data is stored in memories so that different circuits can use the same BIST structure by only changing the data in the memories. New approaches are proposed for compressing and storing the bit-flipping data. Experimental results show that the proposed method reduces the size of the memory considerably while using similar test lengths as a recent method based on bit-fixing