• DocumentCode
    3017949
  • Title

    Skin Detail Analysis for Face Recognition

  • Author

    Pierrard, Jean-Sébastien ; Vetter, Thomas

  • Author_Institution
    Univ. of Basel, Basel
  • fYear
    2007
  • fDate
    17-22 June 2007
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    This paper presents a novel framework to localize in a photograph prominent irregularities in facial skin, in particular nevi (moles, birthmarks). Their characteristic configuration over a face is used to encode the person´s identity independent of pose and illumination. This approach extends conventional recognition methods, which usually disregard such small scale variations and thereby miss potentially highly discriminative features. Our system detects potential nevi with a very sensitive multi scale template matching procedure. The candidate points are filtered according to their discriminative potential, using two complementary methods. One is a novel skin segmentation scheme based on gray scale texture analysis that we developed to perform outlier detection in the face. Unlike most other skin detection/segmentation methods it does not require color input. The second is a local saliency measure to express a point´s uniqueness and confidence taking the neighborhood´s texture characteristics into account. We experimentally evaluate the suitability of the detected features for identification under different poses and illumination on a subset of the FERET face database.
  • Keywords
    face recognition; image segmentation; image texture; FERETface database; face detection; face recognition; gray scale texture analysis; local saliency measure; photograph prominent irregularities; recognition methods; skin detection; skin segmentation; skin segmentation scheme; Computer science; Computer vision; Face detection; Face recognition; Facial features; Lighting; Performance analysis; Principal component analysis; Skin; Spatial databases;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition, 2007. CVPR '07. IEEE Conference on
  • Conference_Location
    Minneapolis, MN
  • ISSN
    1063-6919
  • Print_ISBN
    1-4244-1179-3
  • Electronic_ISBN
    1063-6919
  • Type

    conf

  • DOI
    10.1109/CVPR.2007.383264
  • Filename
    4270289