• DocumentCode
    3019426
  • Title

    Efficient capacitance computation for structures with nonuniform adaptive surface meshes

  • Author

    Jandhyala, Vikram ; Savage, Scott ; Bracken, Eric ; Cendes, Zoltan

  • Author_Institution
    Ansoft Corp., Pittsburgh, PA, USA
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    543
  • Lastpage
    548
  • Abstract
    Circuit parasitic extraction problems are typically formulated using discretized integral equations that use basis functions defined over tesselated surface meshes. The fast multipole method (FMM) accelerates the solution process by rapidly evaluating potentials and fields due to these basis functions. Unfortunately, the FMM suffers from the drawback that its efficiency degrades if the surface mesh has disparately-sized elements in close proximity to each other. Closely-spaced non-uniformly sized elements can appear in realistic situations for a variety of reasons: owing to mesh refinement, due to accurate modeling requirements for fine structural features, and because of the presence of thin doubly-walled structures. In this paper, modifications to the standard multilevel FMM are presented that permit efficient potential and field evaluation over specific non-uniform meshes. The efficiency of the new technique is demonstrated through examples involving large surface meshes with nonuniformly sized elements in close proximity
  • Keywords
    capacitance; circuit simulation; equivalent circuits; high-speed integrated circuits; integral equations; integrated circuit modelling; logic simulation; mesh generation; capacitance computation; circuit parasitic extraction problems; circuit simulation; discretized integral equations; equivalent circuits; fast multipole method; field evaluation; logic simulation; nonuniform adaptive surface meshes; nonuniform meshes; nonuniformly sized elements; tesselated surface meshes; Acceleration; Circuits; Conductors; Degradation; Dielectric losses; Integral equations; Iterative algorithms; Message-oriented middleware; Parasitic capacitance; Surface resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 1999. Proceedings. 36th
  • Conference_Location
    New Orleans, LA
  • Print_ISBN
    1-58113-092-9
  • Type

    conf

  • DOI
    10.1109/DAC.1999.781375
  • Filename
    781375