• DocumentCode
    301949
  • Title

    Noise properties of CMOS current conveyors

  • Author

    Bruun, Erik

  • Author_Institution
    Dept. of Inf. Technol., Tech. Univ., Lyngby, Denmark
  • Volume
    1
  • fYear
    1996
  • fDate
    12-15 May 1996
  • Firstpage
    144
  • Abstract
    The definition of the current conveyor is presented and it is shown how different generations of current conveyors can all be combined into a single definition of a multiple-output second generation current conveyor (CCII). Next, noise sources are introduced into the model, and a general noise model for the current conveyor is established. This model is used for the analysis of selected examples of current conveyor based operational amplifier configurations and the relative merits with respect to the noise performance of these configurations are discussed. Finally, the noise model is developed for a CMOS current conveyor implementation, and optimization strategies for noise reduction are discussed. It is concluded that a class AB implementation provides more flexibility than does a class A configuration. In both cases it is essential to design low noise current mirrors and current sources, and with the class AB design the current mirror and current source noise can be reduced by using small values of bias current without compromising the maximum available output current
  • Keywords
    CMOS analogue integrated circuits; current conveyors; integrated circuit modelling; integrated circuit noise; operational amplifiers; CCII; CMOS current conveyor; class A design; class AB design; current mirror; current source; multiple-output second generation current conveyor; noise model; operational amplifier; optimization; Electronic mail; Information technology; Mirrors; Noise generators; Noise reduction; Operational amplifiers; Performance analysis; Semiconductor device modeling; Signal processing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1996. ISCAS '96., Connecting the World., 1996 IEEE International Symposium on
  • Conference_Location
    Atlanta, GA
  • Print_ISBN
    0-7803-3073-0
  • Type

    conf

  • DOI
    10.1109/ISCAS.1996.539829
  • Filename
    539829