• DocumentCode
    3023139
  • Title

    Electric field induced enhancement in multisubband electron mobility in strained GaAs/InGaAs double quantum well structures

  • Author

    Sahu, Trinath ; Palo, Scott ; Sahoo, N.

  • Author_Institution
    Nat. Inst. of Sci. & Technol., Berhampur, India
  • fYear
    2012
  • fDate
    19-21 Sept. 2012
  • Firstpage
    47
  • Lastpage
    51
  • Abstract
    We study the effect of external electric field F in enhancing the multisubband electron mobility mediated by intersubband effects in a pseudomorphic GaAs/InxGa1-xAs coupled double quantum well structure. An electric field F changes the potential profile of the structure which in turn amends the subband energy levels and wave functions. By varying F, the occupation of different subbands can be changed. As a result the system can be transformed from double subband occupancy to single subband occupancy resulting enhancement in the mobility due to the suppression of intersubband interaction. We show that the effect of the doping concentration and hence the 2D-electron density on the electric field dependence of the subband mobility yields interesting results.
  • Keywords
    III-V semiconductors; electric fields; electron mobility; gallium arsenide; semiconductor doping; semiconductor quantum wells; 2D-electron density; GaAs-InGaAs; doping concentration; double subband occupancy; electric field dependence; electric field induced enhancement; external electric field; intersubband effect; intersubband interaction suppression; multisubband electron mobility; pseudomorphic coupled double quantum well structure; strained double quantum well structure; subband mobility; Doping; Electric fields; Electric potential; Electron mobility; Energy states; Gallium arsenide; Scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Electronics (ICSE), 2012 10th IEEE International Conference on
  • Conference_Location
    Kuala Lumpur
  • Print_ISBN
    978-1-4673-2395-6
  • Electronic_ISBN
    978-1-4673-2394-9
  • Type

    conf

  • DOI
    10.1109/SMElec.2012.6417088
  • Filename
    6417088