DocumentCode
3024859
Title
Electromechanical coupling coefficient of semiconducting hexagonal crystal measured by Brillouin scattering
Author
Yanagitani, Takahiko ; Yoshida, Taisuke ; Matsukawa, Mami
Author_Institution
Grad. Sch. of Eng., Nagoya Inst. of Technol., Nagoya
fYear
2008
fDate
2-5 Nov. 2008
Firstpage
1487
Lastpage
1490
Abstract
Super high frequency (SHF) acoustic measurement realizes the piezoelectric characterization in semiconducting material without the effect of electrical conducting. We have proposed the method for measuring shear and extensional electromechanical coupling coefficient k15 and k33 in a semiconducting crystal simultaneously, using Brillouin scattering method. In ZnO crystal, k15 value measured from measured acoustic velocities was in good accordance with the previously reported constant. We also have found large variety in effective piezoelectricity, implying variety of resistivity in the ZnO crystal.
Keywords
Brillouin spectra; acoustic wave scattering; acoustic wave velocity; electromechanical effects; piezoelectric semiconductors; zinc compounds; Brillouin scattering; ZnO; ZnO crystal resistivity; acoustic velocity; electromechanical coupling coefficient; piezoelectric characterization; semiconducting hexagonal crystal; semiconducting material; shear measurement; super high frequency acoustic measurement; Acoustic measurements; Brillouin scattering; Conducting materials; Crystalline materials; Frequency; Piezoelectric materials; Semiconductivity; Semiconductor materials; Velocity measurement; Zinc oxide; Brillouin scattering; Electromechanical coupling coefficient; Piezoelectric semiconductor; ZnO; component;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium, 2008. IUS 2008. IEEE
Conference_Location
Beijing
Print_ISBN
978-1-4244-2428-3
Electronic_ISBN
978-1-4244-2480-1
Type
conf
DOI
10.1109/ULTSYM.2008.0362
Filename
4803544
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