• DocumentCode
    3025260
  • Title

    Modeling of SOI-based MRR by coupled mode theory using lateral coupling configuration

  • Author

    Hazura, H. ; Menon, P. Susthitha ; Majlis, Burhanuddin Yeop ; Hanim, A.R. ; Mardiana, B. ; Hasanah, Lilik ; Mulyanti, Budi ; Mahmudin, D. ; Wiranto, G.

  • Author_Institution
    Inst. of Microeng. & Nanoelectron. (IMEN), Univ. Kebangsaan Malaysia (UKM), Bangi, Malaysia
  • fYear
    2012
  • fDate
    19-21 Sept. 2012
  • Firstpage
    422
  • Lastpage
    425
  • Abstract
    We present the modeling of a first order waveguide-coupled microring resonator (MRR) by coupled mode theory (CMT) using transfer matrix model. The design topology is based on the lateral coupling configuration and single mode propagation which is integrated on a Silicon-on-Insulator (SOI) platform. Performance parameters including Free Spectral Range (FSR) and Quality Factor (Q-factor) are investigated. For verification, we compare these results with the results obtained from the Finite Difference Time Domain (FDTD) commercially available software. We found that both results agree well with each other.
  • Keywords
    Q-factor; coupled mode analysis; finite difference time-domain analysis; optical couplers; optical waveguides; resonators; silicon-on-insulator; CMT; FDTD commercially available software; FSR; Q-factor; SOI-based MRR modeling; coupled mode theory; design topology; finite difference time domain commercially available software; first order waveguide-coupled MRR; first order waveguide-coupled microring resonator; free spectral range; lateral coupling configuration; performance parameters; quality factor; silicon-on-insulator platform; single mode propagation; transfer matrix model; Couplings; Optical filters; Optical resonators; Optical waveguide theory; Q factor; Refractive index;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Electronics (ICSE), 2012 10th IEEE International Conference on
  • Conference_Location
    Kuala Lumpur
  • Print_ISBN
    978-1-4673-2395-6
  • Electronic_ISBN
    978-1-4673-2394-9
  • Type

    conf

  • DOI
    10.1109/SMElec.2012.6417177
  • Filename
    6417177