• DocumentCode
    3026513
  • Title

    InAsP/In[Ga]P MQWs for 1.55 μm modulators grown by solid-source MBE

  • Author

    Guy, P. ; Farley, R.J. ; Haywood, S.K. ; Hewer, V.A. ; Hogg, J.H.C. ; David, J.P.R. ; Hopkinson, M. ; Pate, M.

  • Author_Institution
    Dept. of Electron. Eng., Hull Univ., UK
  • fYear
    1997
  • fDate
    11-15 May 1997
  • Firstpage
    440
  • Lastpage
    443
  • Abstract
    Two multi-quantum wells of nominal composition In0.45As 0.55P/InP and In0.4As0.5P/In0.95 Ga0.5P have been grown by solid source MBE. X-ray diffraction showed that neither structure was relaxed with respect to the substrate despite compressive well strain of 1.6-1.8%. Optical characterization showed narrow exciton linewidths (~20 meV FWHM) at room temperature. An absorption coefficient at the exciton peak of 21000 cm -1 was found from transmission measurements. There is also a rapid Stark shift for these 85 nm wells leading to maximum modulation at only 4-5 V for a 0.3 μm intrinsic region. These results imply that for a similar 50 period structure with a 1 μm intrinsic region a contrast ratio of 2.3 dB could be achieved at less than 20 V
  • Keywords
    III-V semiconductors; X-ray diffraction; absorption coefficients; electro-optical modulation; excitons; gallium compounds; indium compounds; internal stresses; molecular beam epitaxial growth; photoluminescence; quantum confined Stark effect; semiconductor growth; semiconductor quantum wells; 1.55 mum; 21000 cm-1; 4 to 5 V; 85 nm; In0.45As0.55P-InP; In0.4As0.5P-In0.95Ga0.5 P; InAsP/In(Ga)P MQWs; InP; X-ray diffraction; absorption coefficient; compressive well strain; contrast ratio; maximum modulation; modulators; multi-quantum wells; narrow exciton linewidths; optical characterization; photocurrent spectra; photoluminescence spectra; quantum confined Stark shift; rapid Stark shift; solid-source MBE; transmission measurements; Capacitive sensors; Electromagnetic wave absorption; Excitons; Indium phosphide; Optical diffraction; Optical modulation; Quantum well devices; Solids; Temperature; X-ray diffraction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials, 1997., International Conference on
  • Conference_Location
    Cape Cod, MA
  • ISSN
    1092-8669
  • Print_ISBN
    0-7803-3898-7
  • Type

    conf

  • DOI
    10.1109/ICIPRM.1997.600188
  • Filename
    600188