Simulation-based maximum power estimation

Author

Hill, Anthony M. ; Teng, Chin-Chi ; Kang, Sung-Mo

Author_Institution

Dept. of Electr. Eng., Illinois Univ., Urbana, IL, USA

Volume

4

fYear

1996

fDate

12-15 May 1996

Firstpage

13

Abstract

In this paper we consider estimation of maximum switching density in the context of power consumption and reliability. By using order statistics and nonparametric statistical methods, we obtain a relationship between the number of applied patterns, n, the estimated maximum power consumption, Pˆ_max, and the true maximum power consumption, P_max. Experimental results for the ISCAS 85 benchmark circuits are provided to show the validity of our techniques

Keywords

ULSI; circuit CAD; digital simulation; integrated circuit reliability; logic CAD; nonparametric statistics; IC reliability; ISCAS 85 benchmark circuits; ULSI; applied patterns; logic simulation; maximum power consumption; maximum power estimation; maximum switching density; nonparametric statistical methods; order statistics; power consumption; Circuit simulation; Distribution functions; Energy consumption; Integrated circuit reliability; Logic; Parametric statistics; Statistical analysis; Statistical distributions; Switching circuits; Temperature;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 1996. ISCAS '96., Connecting the World., 1996 IEEE International Symposium on

Conference_Location

Atlanta, GA

Print_ISBN

0-7803-3073-0

Type

conf

DOI

10.1109/ISCAS.1996.541889

Filename

541889