Correlated light beam induced current and infrared thermography mapping applied to the local characterization of large area multicrystalline solar cells

Author

Boyeaux, J.P. ; Kaminski, A. ; Ferrer, N. ; Berger, S. ; Laugier, A.

Author_Institution

Lab. de Phys. de la Matiere, Inst. Nat. des Sci. Appliquees, Villeurbanne, France

fYear

2000

fDate

2000

Firstpage

319

Lastpage

322

Abstract

The aim of this paper is to use light-beam-induced current (LBIC) mapping and infrared thermography (IRT) associated with signal treatment processing to characterize large area solar cells. Samples used in this study are industrial 10 cm ×10 cm multicrystalline silicon solar cells. In the LBIC experimental setup a laser diode (780 nm) is used in a modulated mode. The spot diameter and the depth of field of the incident beam are 20 μm and 80 μm respectively. For thermal mapping, the infrared camera is an Agema 880 SW with an InSb detector. Comparison and correlation between the two nondestructive techniques are presented for analysis of local shunts and defects

Keywords

OBIC; crystal defects; infrared imaging; nondestructive testing; silicon; solar cells; LBIC; Si; correlated light beam induced current; defects; infrared thermography mapping; large area multicrystalline solar cells; local characterization; local shunts; modulated mode; nondestructive techniques; signal treatment processing; spot diameter; thermal mapping; Absorption; Diode lasers; Infrared detectors; Laser beams; Optical surface waves; Photoconductivity; Photovoltaic cells; Signal mapping; Signal processing; Silicon;

fLanguage

English

Publisher

ieee

Conference_Titel

Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE

Conference_Location

Anchorage, AK

ISSN

0160-8371

Print_ISBN

0-7803-5772-8

Type

conf

DOI

10.1109/PVSC.2000.915827

Filename

915827