• DocumentCode
    3028684
  • Title

    Optimal rare event Monte Carlo for Markov modulated regularly varying random walks

  • Author

    Murthy, Karthyek R. A. ; Juneja, Sandeep ; Blanchet, Jose

  • Author_Institution
    Tata Inst. of Fundamental Res., Mumbai, India
  • fYear
    2013
  • fDate
    8-11 Dec. 2013
  • Firstpage
    564
  • Lastpage
    576
  • Abstract
    Most of the efficient rare event simulation methodology for heavy-tailed systems has concentrated on processes with stationary and independent increments. Motivated by applications such as insurance risk theory, in this paper we develop importance sampling estimators that are shown to achieve asymptotically vanishing relative error property (and hence are strongly efficient) for the estimation of large deviation probabilities in Markov modulated random walks that possess heavy-tailed increments. Exponential twisting based methods, which are effective in light-tailed settings, are inapplicable even in the simpler case of random walk involving i.i.d. heavy-tailed increments. In this paper we decompose the rare event of interest into a dominant and residual component, and simulate them independently using state-independent changes of measure that are both intuitive and easy to implement.
  • Keywords
    Markov processes; importance sampling; insurance; optimisation; probability; random processes; risk management; simulation; Markov modulated regularly varying random walks; asymptotically vanishing relative error property; deviation probabilities; exponential twisting based methods; heavy-tailed increments; heavy-tailed systems; importance sampling estimators; insurance risk theory; light-tailed settings; optimal rare event Monte Carlo; rare event simulation methodology; state-independent changes-of-measure; Computational modeling; Heuristic algorithms; Markov processes; Monte Carlo methods; Random variables; Tin; Zinc;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation Conference (WSC), 2013 Winter
  • Conference_Location
    Washington, DC
  • Print_ISBN
    978-1-4799-2077-8
  • Type

    conf

  • DOI
    10.1109/WSC.2013.6721451
  • Filename
    6721451