DocumentCode
3030078
Title
Recent research trends in gate engineered tunnel FET for improved current behavior by subduing the ambipolar effects: A review
Author
Bagga, Navjeet ; Sarkhel, Saheli ; Sarkar, Subir Kumar
Author_Institution
Dept. of Electron. & Telecommun. Eng., Jadavpur Univ., Kolkata, India
fYear
2015
fDate
15-16 May 2015
Firstpage
1264
Lastpage
1267
Abstract
The gradual progress in the development of a Tunnel Field Effect transistor as a suitable alternative to conventional Metal Oxide Semiconductor Field Effect Transistor for achieving superior current performance in nanoscale low power device has been considered in this review. Beginning from a simple p-i-n reverse biased diode, we have tried to cover various recently developed gate engineered TFET structures in terms of their current behavior to show that by cleverly engineering the gate electrode, TFETs with superior current characteristics can be realized. Apart from this, we have also presented a concise discussion on the problem and possible solution of ambipolarity in TFETs, thereby making the use TFETs with low leakage current possible in complimentary digital circuits.
Keywords
field effect transistors; leakage currents; nanoelectronics; p-i-n diodes; tunnel transistors; ambipolar effects; complimentary digital circuits; gate electrode; improved current behavior; low leakage current; metal oxide semiconductor field effect transistor; nanoscale low power device; p-i-n reverse biased diode; tunnel FET; tunnel field effect transistor; Field effect transistors; Logic gates; P-i-n diodes; Silicon; Tunneling; Ambipolarity; Doping-less; Double gate; Subthreshold slope; Tunnel FET; Work function;
fLanguage
English
Publisher
ieee
Conference_Titel
Computing, Communication & Automation (ICCCA), 2015 International Conference on
Conference_Location
Noida
Print_ISBN
978-1-4799-8889-1
Type
conf
DOI
10.1109/CCAA.2015.7148569
Filename
7148569
Link To Document