• DocumentCode
    3032511
  • Title

    Monte Carlo analysis of tunneling and thermionic transport in a reverse biased Schottky diode

  • Author

    Pascual, Elena ; Rengel, Raúl ; Martín, Maríia J.

  • Author_Institution
    Univ. de Salamanca, Salamanca
  • fYear
    2007
  • fDate
    Jan. 31 2007-Feb. 2 2007
  • Firstpage
    108
  • Lastpage
    111
  • Abstract
    A Monte Carlo investigation of transport through Schottky barriers is presented. A WKB based injection-absorption model has been developed, thus allowing correctly reproducing the experimental J-V curves. The reverse-bias regime is analyzed in depth, and the main features of charge transport (including the evidence of quasiballistic phenomena) are discussed by considering internal quantities such as average energy, velocity and concentration of carriers, electric field and potential profiles, together with velocity distribution functions. Tunneling processes show to have a great importance for low and moderately high reverse applied voltages.
  • Keywords
    Monte Carlo methods; Schottky barriers; Schottky diodes; tunnelling; Monte Carlo analysis; Schottky barriers; Schottky diode; charge transport; injection-absorption model; thermionic transport; tunneling transport; velocity distribution functions; Absorption; Distribution functions; MOSFETs; Monte Carlo methods; Ohmic contacts; Schottky barriers; Schottky diodes; Silicides; Tunneling; Voltage; Monte Carlo device simulator; Schottky barriers; WKB approach; quantum transmission coefficient;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices, 2007 Spanish Conference on
  • Conference_Location
    Madrid
  • Print_ISBN
    1-4244-0868-7
  • Type

    conf

  • DOI
    10.1109/SCED.2007.384005
  • Filename
    4271180