DocumentCode
3032511
Title
Monte Carlo analysis of tunneling and thermionic transport in a reverse biased Schottky diode
Author
Pascual, Elena ; Rengel, Raúl ; Martín, Maríia J.
Author_Institution
Univ. de Salamanca, Salamanca
fYear
2007
fDate
Jan. 31 2007-Feb. 2 2007
Firstpage
108
Lastpage
111
Abstract
A Monte Carlo investigation of transport through Schottky barriers is presented. A WKB based injection-absorption model has been developed, thus allowing correctly reproducing the experimental J-V curves. The reverse-bias regime is analyzed in depth, and the main features of charge transport (including the evidence of quasiballistic phenomena) are discussed by considering internal quantities such as average energy, velocity and concentration of carriers, electric field and potential profiles, together with velocity distribution functions. Tunneling processes show to have a great importance for low and moderately high reverse applied voltages.
Keywords
Monte Carlo methods; Schottky barriers; Schottky diodes; tunnelling; Monte Carlo analysis; Schottky barriers; Schottky diode; charge transport; injection-absorption model; thermionic transport; tunneling transport; velocity distribution functions; Absorption; Distribution functions; MOSFETs; Monte Carlo methods; Ohmic contacts; Schottky barriers; Schottky diodes; Silicides; Tunneling; Voltage; Monte Carlo device simulator; Schottky barriers; WKB approach; quantum transmission coefficient;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices, 2007 Spanish Conference on
Conference_Location
Madrid
Print_ISBN
1-4244-0868-7
Type
conf
DOI
10.1109/SCED.2007.384005
Filename
4271180
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