DocumentCode
3032748
Title
Electrodeposited CuIn(S, Se)2 films for low cost high efficiency solar cell applications: microstructural analysis
Author
Izquierdo-Roca, V. ; Álvarez-García, J. ; Pérez-Rodríguez, A. ; Calvo-Barrio, L. ; Romano-Rodríguez, A. ; Morante, J.R. ; Ramdani, O. ; Bermudez, V. ; Grand, P.P. ; Parissi, L. ; Kerrec, O.
Author_Institution
Univ. de Barcelona, Barcelona
fYear
2007
fDate
Jan. 31 2007-Feb. 2 2007
Firstpage
146
Lastpage
149
Abstract
This paper describes the detailed microstructral characterisation of S-rich CuIn(S,Se)2 absorbers fabricated by single step electrodeposition (ED) of nanocrystalline CuInSe2 precursors followed by rapid thermal annealing under sulphurising conditions. This has allowed identifying the main secondary phases in the precursors as elemental Se, CuSe and Cu2Se. The Raman spectra from these precursors also show the presence of Cu-poor OVC domains, which contrasts with the Cu-rich conditions used in the ED growth. This has been related to the presence in the annealed layers of In rich secondary phases, which lead to a slightly Cu poor composition. Moreover, the used sulphurising conditions also lead to the formation of a relatively thick MoS2 layer between the absorber and the Mo back contact. The high microcrystalline quality of the layers is likely responsible of the relatively high efficiency value of 11% of the solar cells fabricated with these absorbers.
Keywords
Raman spectra; copper compounds; crystal microstructure; electrodeposition; indium compounds; nanostructured materials; nanotechnology; rapid thermal annealing; solar cells; ternary semiconductors; thin film devices; CuIn(SSe)2; Raman spectra; microstructral characterisation; nanocrystalline precursors; rapid thermal annealing; single step electrodeposition; solar cell fabrication; sulphurising condition; Annealing; Chemical technology; Costs; Performance evaluation; Photovoltaic cells; Production; Raman scattering; Scanning electron microscopy; Spectroscopy; Transistors; CuIn(S,Se)2; Raman scattering; microstructural analysis; thin film solar cells;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices, 2007 Spanish Conference on
Conference_Location
Madrid
Print_ISBN
1-4244-0868-7
Type
conf
DOI
10.1109/SCED.2007.384014
Filename
4271190
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