• DocumentCode
    3034179
  • Title

    High-temperature characteristics of 1.3-μm InAsP/InAlGaAs MQW lasers

  • Author

    Yamada, Mitsuki ; Anan, Takayoshi ; Tokutome, Keiichi ; Sugou, Shigeo

  • Author_Institution
    Opto-Electron. Res. Labs., NEC Corp., Tsukuba, Japan
  • fYear
    1997
  • fDate
    11-15 May 1997
  • Firstpage
    559
  • Lastpage
    562
  • Abstract
    Low-cost long-wavelength lasers operating at high temperatures without cooling systems are required for optical subscriber systems. InAsP multi-quantum-well (MQW) lasers have been attracting much interest because of their good high-temperature performance. This performance has been attributed to a large conduction band discontinuity (ΔEc ) preventing carrier leakage in the InAsP/InP system compared with conventional InGaAsP/InP systems. However, our recent study revealed a relatively small ΔEc in the InAsP/InP system. Based on this band line-up, it is possible to form a type-I band profile by using InAlGaAs as a barrier instead of InGaAsP. The InAsP/InAlGaAs QW system should have a large ΔEc (>300 meV) sufficient to suppress the carrier leakage at a high temperature. In this paper, we present the band line-up study of this system and report on growth and characterization of this newly proposed strain-compensated InAsP/InAlGaAs MQW lasers for the first time. The lasers exhibited a threshold current density of 1.1 kA/cm2 with a characteristic temperature as high as 116 K which is promising for realizing a cooling system free 1.3-μm laser
  • Keywords
    III-V semiconductors; aluminium compounds; conduction bands; gallium arsenide; indium compounds; quantum well lasers; 1.3 micron; InAsP-InAlGaAs; band line-up; carrier leakage; characteristic temperature; conduction band discontinuity; growth; high-temperature characteristics; strain-compensated InAsP/InAlGaAs MQW laser; threshold current density; Absorption; Artificial intelligence; Charge carrier processes; Cooling; Indium phosphide; Laboratories; National electric code; Quantum well devices; Temperature; Threshold current;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials, 1997., International Conference on
  • Conference_Location
    Cape Cod, MA
  • ISSN
    1092-8669
  • Print_ISBN
    0-7803-3898-7
  • Type

    conf

  • DOI
    10.1109/ICIPRM.1997.600228
  • Filename
    600228