DocumentCode
3034376
Title
Local laser irradiation technique for SEE testing of ICs
Author
Chumakov, Alexander I. ; Pechenkin, Alexander A. ; Savchenkov, Dmitry V. ; Tararaksin, Alexander S. ; Vasil´ev, Alexey L. ; Yanenko, Andrey V.
Author_Institution
Specialized Electron. Syst., Moscow, Russia
fYear
2011
fDate
19-23 Sept. 2011
Firstpage
449
Lastpage
453
Abstract
The results of local laser simulation for estimation of SEE parameters are presented. Simulation method is based on the local laser irradiation of VLSI by measuring response in power supply circuits and determining laser threshold energy of SEE.
Keywords
VLSI; integrated circuit testing; measurement by laser beam; power supply circuits; radiation effects; IC SEE testing; SEE parameter estimation; VLSI simulation method; local laser irradiation technique; local laser simulation; measurement by laser beam; power supply circuits; Laser modes; Measurement by laser beam; Radiation effects; Semiconductor lasers; Very large scale integration; measurement by laser beam; radiation effects; very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
Conference_Location
Sevilla
ISSN
0379-6566
Print_ISBN
978-1-4577-0585-4
Type
conf
DOI
10.1109/RADECS.2011.6131420
Filename
6131420
Link To Document