DocumentCode
3041727
Title
Growth and Characterisation of InAs/GaAs Quantum Dots Grown by MOCVD
Author
Sears, Kallista ; Wong-Leung, Jenny ; Buda, Manuela ; Tan, H.H. ; Jagadish, C.
Author_Institution
Dept. of Electron. Mater. Eng., Australian Nat. Univ., Canberra, ACT
fYear
2004
fDate
8-8 Dec. 2004
Firstpage
1
Lastpage
4
Abstract
InAs/GaAs quantum dots (QDs) were grown by low pressure metal-organic chemical vapour deposition in the Stranski-Krastanow growth mode. We describe the influence of growth parameters such as coverage, the V/III ratio, growth temperature and growth interrupts on the QD nucleation and the importance of avoiding formation of larger islands which are particularly susceptible to dislocations. After an extensive study of these growth parameters we are now able to achieve device quality InAs/GaAs QDs with a density of 3times1010 cm-2. Three layers of these QDs have been incorporated into a thin p-clad laser structure which lases from an excited state due to high absorption loss and insufficient ground state gain
Keywords
III-V semiconductors; MOCVD; excited states; gallium arsenide; ground states; indium compounds; nucleation; self-assembly; semiconductor growth; semiconductor quantum dots; InAs-GaAs; InAs/GaAs quantum dots; MOCVD; QD nucleation; Stranski-Krastanow growth; absorption loss; dislocations; excited state; ground state gain; metal-organic chemical vapour deposition; thin p-clad laser structure; Chemical lasers; Chemical vapor deposition; Gallium arsenide; Inorganic materials; MOCVD; Quantum dot lasers; Quantum dots; Temperature measurement; Transmission electron microscopy; US Department of Transportation;
fLanguage
English
Publisher
ieee
Conference_Titel
Optoelectronic and Microelectronic Materials and Devices, 2004 Conference on
Conference_Location
Brisbane, Qld.
Print_ISBN
0-7803-8820-8
Type
conf
DOI
10.1109/COMMAD.2004.1577477
Filename
1577477
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