• DocumentCode
    3041901
  • Title

    Memory Technologies for Neural Networks

  • Author

    Merrikh-Bayat, F. ; Prezioso, M. ; Guo, X. ; Hoskins, B. ; Strukov, D.B. ; Likharev, K.K.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., UCSB Santa Barbara, Santa Barbara, CA, USA
  • fYear
    2015
  • fDate
    17-20 May 2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Synapses, the most numerous elements of neural networks, are memory devices. Similarly to traditional memory applications, device density is one of the most essential metrics for large-scale artificial neural networks. This application, however, imposes a number of additional requirements, such as the continuous change of the memory state, so that novel engineering approaches are required. In this paper, we briefly review our recent efforts at addressing these needs. We start by reviewing the CrossNet concept, which was conceived to address major challenges of artificial neural networks. We then discuss the recent progress toward CrossNet implementation, in particular the experimental results for simple networks with crossbar-integrated resistive switching (memristive) metal oxide devices. Finally, we review preliminary results on redesigning commercial-grade embedded NOR flash memories to enable individual cell tuning. While NOR flash memories are less dense then memristor crossbars, their technology is much more mature and ready for the development of large-scale neural networks.
  • Keywords
    NOR circuits; flash memories; memristor circuits; neural chips; CrossNet concept; cell tuning; commercial-grade embedded NOR flash memory; crossbar-integrated resistive switching metal oxide devices; device density; engineering approach; large-scale artificial neural networks; memory devices; memory technology; memristive metal oxide devices; memristor crossbars; synapses; Arrays; CMOS integrated circuits; Memristors; Microprocessors; Neurons; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Memory Workshop (IMW), 2015 IEEE International
  • Conference_Location
    Monterey, CA
  • Print_ISBN
    978-1-4673-6931-2
  • Type

    conf

  • DOI
    10.1109/IMW.2015.7150295
  • Filename
    7150295