DocumentCode
304400
Title
Surface tension reduction of liquid by applied electric field using vibrating jet method
Author
Sato, Masayuki ; Kudo, Naoya ; Saito, Masahiro
Author_Institution
Dept. of Biol. & Chem. Eng., Gunma Univ., Japan
Volume
3
fYear
1996
fDate
6-10 Oct 1996
Firstpage
1762
Abstract
It has been discussed in previous papers that the surface tension of some liquids decreases during voltage application, and that this could be the main mechanism for dispersion of the liquid. However, no experimental results have been reported except for a few papers. In the present study, the vibrating jet method was employed because this is the only method available to measure surface tension during voltage application without contacting the liquid surface. A simple procedure was developed which used a parallel sheet of laser light to detect the liquid jet waves. Surface tension reduction due to applied voltage was proportional to the square of the voltage. The measured values agreed fairly well with theoretical predictions when the electrical conductivity >10-2 S/n. The surface tension reduction calculated using the measured electric charge was also proportional to the square of the applied voltage. The mechanism causing surface tension reduction during voltage application was found to be the electric charge existing on the liquid surface
Keywords
charge measurement; electric charge; electric field effects; electrical conductivity; electrohydrodynamics; jets; measurement by laser beam; surface phenomena; surface tension; surface tension measurement; applied electric field; electrical conductivity; liquid jet waves detection; liquid surface; measured electric charge; parallel laser light sheet; surface tension measurement; surface tension reduction; vibrating jet method; Charge measurement; Conductivity measurement; Contacts; Current measurement; Electric variables measurement; Laser theory; Liquids; Surface tension; Vibration measurement; Voltage measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Industry Applications Conference, 1996. Thirty-First IAS Annual Meeting, IAS '96., Conference Record of the 1996 IEEE
Conference_Location
San Diego, CA
ISSN
0197-2618
Print_ISBN
0-7803-3544-9
Type
conf
DOI
10.1109/IAS.1996.559306
Filename
559306
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