• DocumentCode
    304422
  • Title

    Shape reconstruction using estimated surface reflectance properties

  • Author

    Ryu, Seok-Hyun ; Kim, Tae-Eun ; Choi, Jong-Soo

  • Author_Institution
    Dept. of Electron. Eng., Chung-Ang Univ., Seoul, South Korea
  • Volume
    1
  • fYear
    1996
  • fDate
    16-19 Sep 1996
  • Firstpage
    29
  • Abstract
    We propose the new method for analyzing the properties of surface reflectance and reconstructing the shape of an object using estimated reflectance parameters. We examine the hybrid reflectance surface which has a specular lobe and a diffuse component, which can be explained by the Torrance-Sparrow (1967) model. A sample sphere made of one material is used to estimate the reflectance properties by using the LMS algorithm. We can obtain the reference image which consists of the surface normal and brightness value using estimated reflectance parameters. The photometric matching method proposed is robust because it matches the object image with the reference image by considering its neighbour brightness distribution. It is expected that the proposed algorithm can be applied in vision inspection systems
  • Keywords
    brightness; image matching; image reconstruction; inspection; least mean squares methods; parameter estimation; photometry; reflectivity; LMS algorithm; Torrance-Sparrow model; brightness value; diffuse component; estimated surface reflectance properties; hybrid reflectance surface; neighbour brightness distribution; object image; photometric matching method; reference image; sample sphere; shape reconstruction; specular lobe; surface normal value; vision inspection systems; Brain modeling; Brightness; Image reconstruction; Least squares approximation; Parameter estimation; Photometry; Reflectivity; Robustness; Shape; Surface reconstruction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing, 1996. Proceedings., International Conference on
  • Conference_Location
    Lausanne
  • Print_ISBN
    0-7803-3259-8
  • Type

    conf

  • DOI
    10.1109/ICIP.1996.559425
  • Filename
    559425