• DocumentCode
    304625
  • Title

    A machine parameter measurement of switched reluctance machines with egg-shape diagram

  • Author

    Chiba, Akira ; Masuda, T. ; Fukao, Tadashi

  • Author_Institution
    Dept. of Electr. Eng., Sci. Univ. of Tokyo, Japan
  • Volume
    2
  • fYear
    1996
  • fDate
    6-10 Oct 1996
  • Firstpage
    728
  • Abstract
    In this paper, a method for the machine parameter measurement of switched reluctance machines is proposed. Inductance variations with respect to the rotor rotational position are approximated with only a sinusoidal function and a constant. The machine parameters are the amplitude of fundamental component L1 and the constant L0. The ratio L1/L0 can be a performance index, which is close to 1 if the machine has better saliency. It is possible to measure these parameters in experiments. A series of input powers Pi and apparent powers S are measured by a digital power meter while applying square waveform voltages and changing the voltage phase angle. These measured points are plotted on a Pi-S diagram. An egg-shape theoretical curve is drawn with the least square method to find the machine parameters. Several test machines are experimented upon. It is found that machine parameters can be measured by the proposed method. It is also found that the performance index has a good correspondence with measured efficiencies
  • Keywords
    computerised instrumentation; least squares approximations; machine testing; machine theory; performance index; power measurement; reluctance machines; apparent power; constants; digital power meter; efficiencies; egg-shape diagram; fundamental component; inductance variations; input power; least square method; machine parameter measurement; machine saliency; performance index; rotor rotational position; sinusoidal function; square waveform voltages; switched reluctance machines; voltage phase angle; Goniometers; Inductance; Least squares approximation; Least squares methods; Performance analysis; Phase measurement; Power measurement; Reluctance machines; Testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Conference, 1996. Thirty-First IAS Annual Meeting, IAS '96., Conference Record of the 1996 IEEE
  • Conference_Location
    San Diego, CA
  • ISSN
    0197-2618
  • Print_ISBN
    0-7803-3544-9
  • Type

    conf

  • DOI
    10.1109/IAS.1996.560167
  • Filename
    560167