DocumentCode
3048141
Title
Single Event Effects On Space Radiation Hardened 64K SRAMs At Room Temperature
Author
Kim, Q. ; Schwartz, H. ; McCarty, K. ; Coss, J. ; Barnes, C.
Author_Institution
California Institute of Technology
fYear
1993
fDate
34171
Firstpage
99
Lastpage
106
Keywords
Circuit testing; Energy exchange; Ion accelerators; Laboratories; Optical pulses; Radiation hardening; Random access memory; Single event upset; Space technology; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation Effects Data Workshop, 1993., IEEE
Print_ISBN
0-7803-1906-0
Type
conf
DOI
10.1109/REDW.1993.700574
Filename
700574
Link To Document