• DocumentCode
    3051892
  • Title

    Processor-core based design and test

  • Author

    Marwedel, Peter

  • Author_Institution
    Dortmund Univ., Germany
  • fYear
    1997
  • fDate
    28-31 Jan 1997
  • Firstpage
    499
  • Lastpage
    502
  • Abstract
    This paper responds to the rapidly increasing use of various cores for implementing systems-on-a-chip. It specifically focusses on processor cores. We give some examples of cores, including DSP cores and application-specific instruction-set processors (ASIPs). We mention market trends for these components, and we touch design procedures, in particular the use of compilers. Finally, we discuss the problem of testing core-based designs. Existing solutions include boundary scan, embedded in-circuit emulation (ICE), the use of processor resources for stimuli/response compaction and self-test programs
  • Keywords
    application specific integrated circuits; circuit CAD; circuit analysis computing; logic testing; DSP cores; application-specific instruction-set processors; boundary scan; compilers; design procedures; embedded in-circuit emulation; processor cores; processor-core based design and test; self-test programs; stimuli/response compaction; systems-on-a-chip; Application specific processors; Automotive electronics; Built-in self-test; Compaction; Digital signal processing; Embedded system; Emulation; Ice; Process design; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 1997. Proceedings of the ASP-DAC '97 Asia and South Pacific
  • Conference_Location
    Chiba
  • Print_ISBN
    0-7803-3662-3
  • Type

    conf

  • DOI
    10.1109/ASPDAC.1997.600316
  • Filename
    600316