• DocumentCode
    3053593
  • Title

    Defect-aware nanocrossbar logic mapping using Bipartite Subgraph Isomorphism & canonization

  • Author

    Gören, Sezer ; Ugurdag, H. Fatih ; Palaz, Okan

  • Author_Institution
    Dept. of Comput. Eng., Bahcesehir Univ., Istanbul, Turkey
  • fYear
    2010
  • fDate
    24-28 May 2010
  • Firstpage
    246
  • Lastpage
    246
  • Abstract
    This paper addresses the NP-complete problem of mapping a logic function on to a nanocrossbar with a known defect map. We first show that this problem can be transformed into a Bipartite SubGraph Isomorphism (BSGI) problem. Then we present our proposed KNS-2DS algorithm, which canonizes both graphs in N2 time (N being the number of nodes) and then matches them in N3 time in the worst case. KNS-2DS uses a K-Neighbor Sort (KNS) to initialize our main contribution 2D-Sort (2DS). 2DS is an iterative rough canonizer that lets a straightforward matching algorithm complete the job. Our algorithm offers very short run-times (due to canonization) compared to previous work and has success on all benchmarks. KNS-2DS is also novel from the perspective of the BSGI problem in the sense that it is based on canonization but not on a search tree with backtracking.
  • Keywords
    computational complexity; graph theory; iterative methods; logic arrays; nanoelectronics; tree searching; 2D sort; KNS-2DS algorithm; NP complete problem; bipartite subgraph isomorphism; defect aware nanocrossbar logic mapping; iterative rough canonizer; k-neighbor sort; logic function mapping; search tree; CMOS logic circuits; Diodes; Iterative algorithms; Logic functions; NP-complete problem; Nanowires; Programmable logic arrays; Reconfigurable architectures; Reconfigurable logic; Runtime; Bipartite Subgraph Isomorphism; Fault Tolerance; Nanelectronics; Reconfigurable Architectures;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ETS), 2010 15th IEEE European
  • Conference_Location
    Praha
  • ISSN
    1530-1877
  • Print_ISBN
    978-1-4244-5834-9
  • Electronic_ISBN
    1530-1877
  • Type

    conf

  • DOI
    10.1109/ETSYM.2010.5512747
  • Filename
    5512747