• DocumentCode
    3054224
  • Title

    Move from Online Test to Fault-Tolerant: Design and Simulation of a Multi-functional MEMS Sensor

  • Author

    Xu, Zhou ; Richardson, Andrew ; Begbie, Mark ; Wang, Changhai

  • Author_Institution
    Dept. of Eng., Lancaster Univ., Lancaster, UK
  • fYear
    2011
  • fDate
    16-18 May 2011
  • Firstpage
    88
  • Lastpage
    95
  • Abstract
    Fault-tolerance is an important design requirement in critical sensor applications. It is conventionally achieved by using redundant components, which increases system´s size, cost and complexity, that are often sacrificed or comprised due to associated limitations. This paper proposes a novel solution to achieve sensor fault-tolerance at the system level instead of the usual approach that targets the component level. The architecture consists of multi-functional sensors which are used to replace conventional single mode sensors, and a data fusion algorithm which provides online test and fault-tolerance. This method has the potential to significantly increase system reliability and supports a reduction in the overheads inherent with the use of redundancy in fault-tolerant systems. A MEMS humidity/pressure sensor has been designed as an example to support the method. The sensor has simple structure, good linearity and sensitivity, and the potential of further integrating a temperature function.
  • Keywords
    fault tolerance; humidity sensors; microsensors; pressure sensors; sensor fusion; MEMS humidity/pressure sensor; critical sensor; data fusion; multifunctional MEMS sensor; online test; redundant components; reliability; sensor fault tolerance; single mode sensors; temperature function; Fault tolerance; Fault tolerant systems; Humidity; Micromechanical devices; Polymers; Sensitivity; Sensors; MEMS; fault-tolerant; health and usage monitoring; humidity sensor; multi-functional sensor; multi-mode sensing; online test; pressure sensor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW), 2011 IEEE 17th International
  • Conference_Location
    Santa Barbara, CA
  • Print_ISBN
    978-1-4577-1144-2
  • Type

    conf

  • DOI
    10.1109/IMS3TW.2011.38
  • Filename
    6132744