Combining scan and trace buffers for enhancing real-time observability in post-silicon debugging

Scan is a known design-for-test technique in manufacturing test that has been successfully applied also to aid post-silicon debugging on testers. However, to achieve real-time observability in-field, embedded trace buffers are needed. In this paper, we discuss how in the presence of enhanced scan chains, trace buffers can be utilized efficiently for real-time debug data acquisition in-field.