DocumentCode
3055705
Title
An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing
Author
Nigh, Phil ; Needham, Wayne ; Butler, Ken ; Maxwell, Peter ; Aitken, Rob
Author_Institution
IBM
fYear
1997
fDate
27 Apr-1 May 1997
Firstpage
459
Lastpage
464
Abstract
This paper describes an experiment in which various semiconductor test methodologies (stuck-fault, functional, delay and IDDq) are applied to an ASIC device. The goal of this project is to provide the data that will enable manufacturers to optimize their application of the various tests. This project was supported through SEMATECH (Project S-121, “Semiconductor Test Method Evaluation ”)
Keywords
application specific integrated circuits; integrated circuit testing; ASIC device; IDDQ testing; delay-fault testing; functional testing; scan testing; semiconductor testing; stuck-fault testing; Application specific integrated circuits; Collaborative work; Conductors; Costs; Delay effects; Instruments; Integrated circuit testing; Manufacturing; Production; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 1997., 15th IEEE
Conference_Location
Monterey, CA
ISSN
1093-0167
Print_ISBN
0-8186-7810-0
Type
conf
DOI
10.1109/VTEST.1997.600334
Filename
600334
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