A Clock Fault Detection Circuit for Reliable High Speed System by Time-to-Voltage Conversion

A novel architecture for clock fault detection circuit for high speed nanoelectronics system is delivered. Time-to-voltage converter is employed for transforming error of time to the error of voltage which is more convenient for error detection. The rapid discharging circuit is also used for system resetting. To illustrate the detection capability by the diction circuit, a prototype CMOS design of this proposed circuit is presented. Simulation result shows that the proposed architecture is very suit for integration to nanoelectronic circuit design to detect the fault of the clock.