• DocumentCode
    3059091
  • Title

    Clustering phenomena considering the density of coupled chaotic circuits networks

  • Author

    Takamaru, Yusuke ; Uwate, Yoko ; Ott, Tammy ; Nishio, Yusuke

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Tokushima Univ., Tokushima, Japan
  • fYear
    2012
  • fDate
    2-5 Dec. 2012
  • Firstpage
    647
  • Lastpage
    650
  • Abstract
    We have investigated the clustering phenomena observed from coupled chaotic circuits networks. The networks are globally coupled with each other by resistor using the distance information. The coupling strength is depended on the distance between the circuits. In this study, we consider the relationship between density and distance of each cluster that configured by chaotic circuits. For this investigation, we study the clustering phenomena when we change the number of circuits in a cluster. Furthermore, we consider the clustering phenomena by changing the distance between each cluster composed of chaotic circuits using 2-dimensional place.
  • Keywords
    chaos; resistors; clustering phenomena; coupled chaotic circuit networks; coupling strength; distance information; resistor; Chaos; Clustering algorithms; Computer simulation; Couplings; Integrated circuit modeling; Mathematical model; Synchronization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (APCCAS), 2012 IEEE Asia Pacific Conference on
  • Conference_Location
    Kaohsiung
  • Print_ISBN
    978-1-4577-1728-4
  • Type

    conf

  • DOI
    10.1109/APCCAS.2012.6419118
  • Filename
    6419118