• DocumentCode
    3059373
  • Title

    Impact Analysis of Configuration Changes for Test Case Selection

  • Author

    Qu, Xiao ; Acharya, Mithun ; Robinson, Brian

  • Author_Institution
    Ind. Software Syst., ABB Corp. Res., Raleigh, NC, USA
  • fYear
    2011
  • fDate
    Nov. 29 2011-Dec. 2 2011
  • Firstpage
    140
  • Lastpage
    149
  • Abstract
    Testing configurable systems, which are becoming prevalent, is expensive due to the large number of configurations and test cases. Existing approaches reduce this expense by selecting or prioritizing configurations. However, these approaches redundantly run the full test suite for the selected configurations. To address this redundancy, we propose a test case selection approach by analyzing the impact of configuration changes with static program slicing. Given an existing test suite T used for testing a system S under a configuration C, our approach decides for each t in T if t has to be used for testing S under a different configuration C´. We have evaluated our approach on a large industrial system within ABB with promising results.
  • Keywords
    program slicing; program testing; configurable system testing; configuration changes; impact analysis; static program slicing; test case selection; Approximation methods; Data structures; Equations; Google; Safety; Switches; Testing; configuration testing; program slicing; static impact analysis; test case selection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Reliability Engineering (ISSRE), 2011 IEEE 22nd International Symposium on
  • Conference_Location
    Hiroshima
  • ISSN
    1071-9458
  • Print_ISBN
    978-1-4577-2060-4
  • Type

    conf

  • DOI
    10.1109/ISSRE.2011.9
  • Filename
    6132962