DocumentCode
3059373
Title
Impact Analysis of Configuration Changes for Test Case Selection
Author
Qu, Xiao ; Acharya, Mithun ; Robinson, Brian
Author_Institution
Ind. Software Syst., ABB Corp. Res., Raleigh, NC, USA
fYear
2011
fDate
Nov. 29 2011-Dec. 2 2011
Firstpage
140
Lastpage
149
Abstract
Testing configurable systems, which are becoming prevalent, is expensive due to the large number of configurations and test cases. Existing approaches reduce this expense by selecting or prioritizing configurations. However, these approaches redundantly run the full test suite for the selected configurations. To address this redundancy, we propose a test case selection approach by analyzing the impact of configuration changes with static program slicing. Given an existing test suite T used for testing a system S under a configuration C, our approach decides for each t in T if t has to be used for testing S under a different configuration C´. We have evaluated our approach on a large industrial system within ABB with promising results.
Keywords
program slicing; program testing; configurable system testing; configuration changes; impact analysis; static program slicing; test case selection; Approximation methods; Data structures; Equations; Google; Safety; Switches; Testing; configuration testing; program slicing; static impact analysis; test case selection;
fLanguage
English
Publisher
ieee
Conference_Titel
Software Reliability Engineering (ISSRE), 2011 IEEE 22nd International Symposium on
Conference_Location
Hiroshima
ISSN
1071-9458
Print_ISBN
978-1-4577-2060-4
Type
conf
DOI
10.1109/ISSRE.2011.9
Filename
6132962
Link To Document