• DocumentCode
    3059487
  • Title

    PAT 3: An Extensible Architecture for Building Multi-domain Model Checkers

  • Author

    Liu, Yang ; Sun, Jun ; Dong, Jin Song

  • Author_Institution
    Nat. Univ. of Singapore, Singapore, Singapore
  • fYear
    2011
  • fDate
    Nov. 29 2011-Dec. 2 2011
  • Firstpage
    190
  • Lastpage
    199
  • Abstract
    Model checking is emerging as an effective software verification method. Although it is desirable to have a dedicated model checker for each application domain, implementing one is rather challenging. In this work, we develop an extensible and integrated architecture in PAT3 (PAT version 3.*) to support the development of model checkers for wide range application domains. PAT3 adopts a layered design with an intermediate representation layer (IRL), which separates modeling languages from model checking algorithms so that the algorithms can be shared by different languages. IRL contains several common semantic models to support wide application domains, and builds both explicit model checking and symbolic model checking under one roof. PAT3 architecture provides extensibility in many possible aspects: modeling languages, model checking algorithms, reduction techniques and even IRLs. Various model checkers have been developed under this new architecture in recent months. This paper discusses the structure and extensibility of this new architecture.
  • Keywords
    program verification; simulation languages; software architecture; symbol manipulation; IRL; PAT3 architecture; application domain; integrated architecture; intermediate representation layer; modeling language; multidomain model checker; reduction technique; software verification method; symbolic model checking; wide range application domain; Algorithm design and analysis; Boolean functions; Data structures; Object oriented modeling; Safety; Semantics; Model Checker; PAT; Software Framework;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Reliability Engineering (ISSRE), 2011 IEEE 22nd International Symposium on
  • Conference_Location
    Hiroshima
  • ISSN
    1071-9458
  • Print_ISBN
    978-1-4577-2060-4
  • Type

    conf

  • DOI
    10.1109/ISSRE.2011.19
  • Filename
    6132967