• DocumentCode
    3060033
  • Title

    On the error exponent to redundancy ratio of interactive encoding and decoding

  • Author

    Meng, Jin ; Yang, En-Hui

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Waterloo, Waterloo, ON, Canada
  • fYear
    2010
  • fDate
    13-18 June 2010
  • Firstpage
    121
  • Lastpage
    125
  • Abstract
    The concept of error exponent to redundancy ratio (EERR) of interactive encoding and decoding (IED), as well as Slepian-Wolf coding (SWC), is defined and investigated in this paper. The EERR of universal IED is determined. In the non-universal coding case, it is shown that for any stationary ergodic source-side information pair, a two stage IED scheme with 3 rounds of interactions or less can be constructed such that its EERR ≥1. Meanwhile, for any memoryless source-side information pair, the EERR of SWC is strictly less than 1 in the region where the error exponent of SWC is determined. Furthermore, practical two stage IED schemes are proposed and implemented by using LDPC codes and Belief Propagation (BP) Decoding, and simulation shows that the error probability of the proposed two stage IED schemes is indeed significantly lower than that of SWC schemes.
  • Keywords
    decoding; encoding; error analysis; parity check codes; probability; BP decoding; EERR; LDPC codes; SWC; Slepian-Wolf coding; belief propagation decoding; error exponent; error exponent to redundancy ratio; error probability; interactive encoding and decoding; memoryless source-side information; nonuniversal coding; stationary ergodic source-side information pair; two-stage IED scheme; Belief propagation; Computer errors; Decoding; Encoding; Error probability; Fluid flow measurement; Parity check codes; Propagation losses; Redundancy; Source coding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Theory Proceedings (ISIT), 2010 IEEE International Symposium on
  • Conference_Location
    Austin, TX
  • Print_ISBN
    978-1-4244-7890-3
  • Electronic_ISBN
    978-1-4244-7891-0
  • Type

    conf

  • DOI
    10.1109/ISIT.2010.5513275
  • Filename
    5513275