• DocumentCode
    3060376
  • Title

    Hierarchical symmetry

  • Author

    Zabrodsky, H. ; Peleg, S. ; Avnir, D.

  • Author_Institution
    Hebrew Univ. of Jerusalem, Israel
  • fYear
    1992
  • fDate
    30 Aug-3 Sep 1992
  • Firstpage
    9
  • Lastpage
    12
  • Abstract
    The authors view symmetry as a continuous feature and dependent on resolution. Combining a continuous symmetry measure (CSM) with a multiresolution scheme, the authors present a method that hierarchically detects symmetric and almost symmetric patterns. Evaluation of symmetry at low frequencies guides the process to find the symmetry at higher frequencies
  • Keywords
    feature extraction; image recognition; almost symmetric patterns; continuous symmetry measure; feature extraction; hierarchical detection; image recognition; multiresolution scheme; Chemistry; Computer science; Face; Frequency; Humans; Layout; Reflection; Retina; Shape measurement; Spatial resolution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition, 1992. Vol.III. Conference C: Image, Speech and Signal Analysis, Proceedings., 11th IAPR International Conference on
  • Conference_Location
    The Hague
  • Print_ISBN
    0-8186-2920-7
  • Type

    conf

  • DOI
    10.1109/ICPR.1992.201915
  • Filename
    201915
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3060376