The application of efficient and unbiased stereotogical 3-D measurement techniques to images from confocal microscopes and magnetic resonance imaging devices

Unbiased measurements of the 3D geometrical properties of micro and macroscopic structures can be obtained from the application of geometrical probes to sections. A new family of estimators of surface, length and spatial distribution have been developed for application to perfectly registered stacks of sections or of projections through them. These estimators are highly efficient and simple to apply.