DocumentCode
3064180
Title
Test time of multiplier/accumulator based output response analyzer in built-in analog functional testing
Author
Qin, Jie ; Stroud, Charles ; Dai, Foster
Author_Institution
Dept. of Electr. & Comput. Eng., Auburn Univ., Auburn, AL
fYear
2009
fDate
15-17 March 2009
Firstpage
363
Lastpage
367
Abstract
A Built-In Self-Test (BIST) approach has been proposed for functionality measurements of analog circuitry in mixed-signal systems. The BIST circuitry consists of a direct digital synthesizer (DDS) based test pattern generator (TPG) and multiplier/accumulator (MAC) based output response analyzer (ORA). In this paper we investigate and discuss the test time required by the ORA for analog measurements such as frequency response and 3rd order intercept point (IP3). We show that the test time can be greatly shortened if the ORA accumulation can be stopped at the right point. Three simple digital circuits are also proposed for such a purpose and their performance is simulated to show how the efficiency of the test time is improved.
Keywords
analogue integrated circuits; automatic test pattern generation; built-in self test; direct digital synthesis; integrated circuit testing; mixed analogue-digital integrated circuits; 3rd order intercept point; analog circuitry; built-in self-test; digital circuits; direct digital synthesizer; frequency response; mixed-signal systems; multiplier-accumulator; output response analyzer; test pattern generator; Built-in self-test; Circuit simulation; Circuit testing; Digital circuits; Frequency measurement; Frequency response; Pattern analysis; Synthesizers; Test pattern generators; Time measurement; BIST; analog functional testing; frequency response measurement, IP3 measurement; test ime;
fLanguage
English
Publisher
ieee
Conference_Titel
System Theory, 2009. SSST 2009. 41st Southeastern Symposium on
Conference_Location
Tullahoma, TN
ISSN
0094-2898
Print_ISBN
978-1-4244-3324-7
Electronic_ISBN
0094-2898
Type
conf
DOI
10.1109/SSST.2009.4806795
Filename
4806795
Link To Document